Description |
1 online resource (xix, 863 pages) : illustrations (some color) |
Contents |
Cover -- Contents -- 1 Introduction -- 1.1 The Discovery of X-Rays and Origin of X-Ray Fluorescence Analysis -- 1.2 Historical Progress of Laboratory X-Ray Fluorescence Spectrometers -- 1.3 Measurement of Soft and Ultrasoft X-Rays -- 1.3.1 X-Ray Tubes for Soft and Ultrasoft X-Rays -- 1.3.2 Scientific Research Work on Soft and Ultrasoft X-Rays -- 1.3.3 Synthetic Multilayer Analyzers -- 1.3.4 Total Reflection Mirrors -- 1.4 Analytical Precision and Accuracy in X-Ray Fluorescence Analysis -- 1.4.1 Correction of Matrix Element Effects -- 1.4.2 Quantitative Analysis of Heat Resistance and High Temperature Alloys -- 1.4.3 Segregation Influencing Analytical Accuracy -- 1.5 Concluding Remarks -- References -- 2 X-Ray Sources -- 2.1 Introduction -- 2.2 X-Ray Tubes -- 2.2.1 Basic Physical Principles -- 2.2.2 Technology of the Components -- 2.2.3 Vacuum Envelope of X-Ray Tubes -- 2.2.4 Tube Housing Assembly -- 2.2.5 Modern X-Ray Tubes -- 2.2.6 Some Applications -- 2.3 Radioisotope Sources -- 2.3.1 Basic Physical Principles -- 2.3.2 Radioisotope Sources -- 2.3.3 Production of Radioactive Sources -- 2.3.4 Radiation Protection Regulations -- 2.4 Synchrotron Radiation Sources -- 2.4.1 SR Basics -- 2.4.2 Storage Ring Description -- 2.4.3 Generation of SR -- 2.4.4 SRW Package -- References -- 3 X-Ray Optics -- 3.1 Introduction -- 3.2 Mirror Optics -- 3.2.1 Total External Reflection Mirrors -- 3.2.2 Capillary Optical Systems -- 3.3 Diffraction Optics -- Elements of Diffraction Theory -- 3.3.1 Electromagnetic Wave Propagation -- 3.3.2 Fraunhofer Approximation -- 3.3.3 Fresnel Approximation -- 3.3.4 Bragg Diffraction -- 3.4 Optics for Monochromators -- 3.4.1 Diffraction Gratings -- 3.4.2 Multilayers for X-Ray Optics -- 3.4.3 HOPG-based Optics -- 3.4.4 Laterally Graded SiGe Crystals -- 3.5 Focusing Diffraction Optics -- 3.5.1 Zone Plates -- 3.5.2 Reflection Zone Plate and Bragg-Fresnel Optics -- 3.5.3 Bragg-Fresnel Holographic Optics -- 3.6 Refraction X-Ray Optics -- 3.6.1 Compound Refractive Lens -- References -- 4 X-Ray Detectors and XRF Detection Channels -- 4.1 Introduction -- 4.2 X-Ray Detectors and Signal Processing -- 4.2.1 Introduction -- 4.2.2 Basic Properties of X-Ray Detectors -- 4.2.3 Classification of the Most Commonly Used X-Ray Detectors -- 4.2.4 Semiconductor Detectors -- 4.2.5 Silicon Drift Detectors -- 4.2.6 Basics of Signal Electronics -- 4.2.7 Shape Factors of some Filtering Amplifiers -- 4.2.8 Auxiliary Functions -- 4.2.9 Appendix 1 -- The Laplace Transform -- 4.2.10 Appendix 2 -- Calculation of the ENC -- 4.2.11 Appendix 3 -- Digital Pulse Processing -- 4.3 High Resolution Imaging X-Ray CCD Spectrometers -- 4.3.1 Introduction -- 4.3.2 Fully Depleted Backside Illuminated pn-CCDs -- 4.3.3 Frame Store pn-CCDs for ROSITA, and XEUS -- 4.3.4 Conclusion -- 4.4 Wavel |
Summary |
X-Ray Fluorescence analysis (XRF) is a multi-elemental and nondestructive analytical method used in research and industrial applications. This book provides self-contained modules featuring XRF instrumentation, quantification methods, and other applications. It gives a survey of the theoretical fundamentals, analytical instrumentation, and more |
Analysis |
materialen |
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materials |
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condenseren |
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condensation |
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fysische chemie |
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physical chemistry |
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vaste stoffen |
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solids |
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fysica |
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physics |
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oppervlakten |
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surfaces |
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grensvlak |
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interface |
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x ray fluorescence |
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materiaalkunde |
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materials science |
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Analytical Chemistry |
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Analytische chemie |
Bibliography |
Includes bibliographical references (pages 783-833) and index |
Notes |
Print version record |
Subject |
X-ray spectroscopy.
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Spectrometry, X-Ray Emission
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x-ray spectroscopy.
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SCIENCE -- Chemistry -- Analytic.
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Chimie.
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Science des matériaux.
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X-ray spectroscopy.
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Genre/Form |
Handbooks and manuals.
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Handbooks and manuals.
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Guides et manuels.
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Form |
Electronic book
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Author |
Beckhoff, B. (Burkhard)
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ISBN |
9783540367222 |
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3540367225 |
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661086442X |
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9786610864423 |
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