Limit search to available items
Book Cover
E-book
Author Arora, N. (Narain), 1943-

Title Mosfet modeling for VLSI simulation : theory and practice / Narain Arora
Published New Jersey : World Scientific, ©2007

Copies

Description 1 online resource (xxiii, 605 pages) : illustrations
Series International series on advances in solid state electronics and technology
International series on advances in solid state electronics and technology.
Contents Foreword; Preface; Contents; List of Symbols; Acronyms; 1 Overview; 2 Review of Basic Semiconductor and pn Junction Theory; 3 MOS Transistor Structure and Operation; 4 MOS Capacitor; 5 Threshold Voltage; 6 MOSFET DC Model; 7 Dynamic Model; 8 Modeling Hot-Carrier Effects; 9 Data Acquisition and Model Parameter Measurements; 10 Model Parameter Extraction Using Optimization Method; 11 SPICE Diode and MOSFET Models and Their Parameters; 12 Statistical Modeling and Worst-case Design Parameters; Appendix A. Important Properties of Silicon, Silicon Dioxide and Silicon Nitride at 300K
Summary A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required
Bibliography Includes bibliographical references and index
Notes Print version record
Subject Metal oxide semiconductor field-effect transistors.
Integrated circuits -- Very large scale integration.
Integrated circuits -- Very large scale integration -- Computer simulation
TECHNOLOGY & ENGINEERING -- Electronics -- Transistors.
Integrated circuits -- Very large scale integration
Integrated circuits -- Very large scale integration -- Computer simulation
Metal oxide semiconductor field-effect transistors
Form Electronic book
ISBN 9789812707581
9812707581