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Title In-situ electron microscopy : applications in physics, chemistry and materials science / edited by Gerhard Dehm, James M. Howe, Josef Zweck
Published Weinheim : WileyVCH ; Chichester : John Wiley [distributor], 2012
Online access available from:
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Description 1 online resource (xviii, 383 pages) : illustrations
Contents pt. 1. Basics and methods -- pt. 2. Growth and interactions -- pt. 3. Mechanical properties -- pt. 4. Physical properties
Summary Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed
Bibliography Includes bibliographical references and index
Notes Print version record
Subject Electron microscopy.
Form Electronic book
Author Dehm, Gerhard.
Howe, James M., 1955-
Zweck, Josef.
ISBN 9783527652167 (electronic bk.)
3527652167 (electronic bk.)
9783527652198 (electronic bk.)
3527652191 (electronic bk.)
3527652183 (ePub)
9783527652181 (ePub)
3527652175 (mmobi)
9783527652174 (mmobi)
9781299157064 (MyiLibrary)
1299157068 (MyiLibrary)
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