Title Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Sergei Kalinin, Alexei Gruverman, editors

Published New York : Springer, ©2007

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Description 1 online resource (2 volumes (xx, 980 pages, 8 unnumbered pages of plates)) : illustrations (some color) Contents Cover -- Contents -- List of Contributors -- About the Editors -- VOLUME II -- Part III. Electrical SPM Characterization of Materials and Devices -- Ch. III. 1. Scanning Voltage Microscopy: Investigating the Inner Workings of Optoelectronic Devices -- Ch. III. 2. Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces -- Ch. III. 3. Electromechanical Behavior in Biological Systems at the Nanoscale -- Ch. III. 4. Scanning Capacitance Microscopy: Applications in Failure Analysis, Active Device Imaging, and Radiation Effects -- Ch. III. 5. Kelvin Probe Force Microscopy of Semiconductors -- Ch. III. 6. Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy -- Ch. III. 7. Electron Flow Through Molecular Structures -- Ch. III. 8. Electrical Characterization of Perovskite Nanostructures by SPM -- Ch. III. 9. SPM Measurements of Electric Properties of Organic Molecules -- Ch. III. 10. High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices -- Part IV. Electrical Nanofabrication -- Ch. IV. 1. Electrical SPM-Based Nanofabrication Techniques -- Ch. IV. 2. Fundamental Science and Lithographic Applications of Scanning Probe Oxidation -- Ch. IV. 3. UHV-STM Nanofabrication on Silicon -- Ch. IV. 4. Ferroelectric Lithography -- Ch. IV. 5. Patterned Self-Assembled Monolayers via Scanning Probe Lithography -- Ch. IV. 6. Resistive Probe Storage: Read/Write Mechanism -- VOLUME I -- Introduction: Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization -- Part I. SPM Techniques for Electrical Characterization -- Ch. I.1. Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport -- Ch. I.2. Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy -- Ch. I.3. Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics -- Ch. I.4. Principles of Kelvin Probe Force Microscopy -- Ch. I.5. Frequency-Dependent Transport Imaging by Scanning Probe Microscopy -- Ch. I.6. Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy -- Ch. I.7. Principles of Near-Field Microwave Microscopy -- Ch. I.8. Electromagnetic Singularities and Resonances in Near-Field Optical Probes -- Ch. I.9. Electrochemical SPM: Fundamentals and Applications -- Ch. I.10. Near-Field High-Frequency Probing -- Part II. Electrical and Electromechanical Imaging at the Limits of Resolution -- Ch. II. 1. Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors -- Ch. II. 2. Spin-Polarized Scanning Tunneling Microscopy -- Ch. II. 3. Scanning Probe Measurements of ElectronTransport in Molecules -- Ch. II. 4. Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices -- Ch. II. 5. Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks -- Ch. II. 6. Theory of Scanning Probe Microscopy -- Ch. II. 7. Multi-Probe Scanning Tunneling Microscopy -- Ch. II. 8. Dynamic Force Microscopy and Spectroscopy in Vacuum -- Ch. II. 9. Scanning Tunneling Microscopy and Spectroscopy of Manganites Summary Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography Bibliography Includes bibliographical references and index Notes Print version record In Springer e-books Subject Scanning probe microscopy. Nanoelectronics. Chemistry. Microscopy. Particles (Nuclear physics) Mechanical engineering. chemistry. microscopy. particle physics. mechanical engineering. SCIENCE -- Electron Microscopes & Microscopy. Nanoelectronics. Scanning probe microscopy. Science des matériaux. Chimie. Nanoelectronics Scanning probe microscopy Form Electronic book Author Kalinin, S. V. (Sergeĭ Vasilʹevich) Gruverman, A. (Alexei) ISBN 9780387286686 0387286683 9780387286679 0387286675 6610817006 9786610817009

Other Titles Electrical and electromechanical phenomena at the nanoscale

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