|
Other relevant titles entries 16-761 |
2019
IFIP International Conference on Digital Forensics (15th : 2019 : Orlando, Fla.)
Rating:
|
2019
Third edition
Boca Raton, Florida : CRC Press, [2019]
Rating:
|
2019
First edition
Baden-Baden, Germany : Nomos ; München, Germany : Beck ; Oxford, United Kingdom ; Chicago, IL, USA : Hart, 2019
Rating:
|
2019
Hulley, Glynn C., author
Amsterdam : Elsevier, 2019
Rating:
|
2019
Leiden ; Boston : Brill, 2019
Rating:
|
2018
Farmington Hills, Michigan : Gale, [2018]
Rating:
|
2018
Farmington Hills, Mich. : St. James Press, a part of Gale, a Cengage Company, [2018]
Rating:
|
2018
Gad, Shayne C
3rd ed
Rating:
|
2018
Cham : Springer International Publishing : Imprint : Springer, 2018
Rating:
|
2018
Carson, Austin, author.
Princeton ; Oxford : Princeton University Press, [2018]
Rating:
|
2018
Leiden : Koninklijke Brill NV, 2018
Rating:
|
2018
Ṿaynshṭeyn, B., 1866-1946, author.
Cambridge : Open Book Publishers, 2018
Rating:
|
2018
Jasinski, Piotr
Rating:
|
|
2018
London : Routledge, Taylor & Francis Group, 2018
Rating:
|
2018
Abeyratne, R. I. R. (Ruwantissa Indranath Ramya), 1951-
Abingdon, Oxon ; New York, NY : Routledge, 2018
Rating:
|
2018
Henry, Claude, author
New York : Columbia University Press, [2018]
Rating:
|
2018
Johnson, Phillip
Rating:
|
2018
Scott, William, 1946- author.
Milton Park, Abingdon, Oxon ; New York, NY : Routledge, [2018]
Rating:
|
2018
Cheneviere, Cédric
Rating:
|
2018
Abeyratne, R. I. R. (Ruwantissa Indranath Ramya), 1951-
Abingdon, Oxon : Routledge, 2018
Rating:
|
|
2018
Milton Park, Abingdon, Oxon ; New York, NY : Routledge, 2018
Rating:
|
2018
Gangale, Thomas, author
Leiden : Brill Nijhoff, 2018
Rating:
|
2018
Boothby, William H., author
Cambridge, United Kingdom ; New York, NY, USA : Cambridge University Press, 2018
Rating:
|
2018
Cambridge, United Kingdom ; New York, NY, USA : Cambridge University Press, 2018
Rating:
|
2018
Hodgkinson, David (David Ivor), author.
New York, NY : Routledge, 2018
Rating:
|
2018
Smith, Preserved
Rating:
|
|
2018
Crane, Harry, author
First edition
Boca Raton, FL : CRC Press, 2018
Rating:
|
2018
Olsen, John Andreas, editor
First edition
London : Taylor and Francis, 2018
Rating:
|
2018
Cambridge, Massachusetts : Harvard University Press, 2018
Rating:
|
2018
Gillespie, Alexander, author
First edition
Oxford : Oxford University Press, 2018
Rating:
|
2018
Cambridge, United Kingdom ; New York, NY, USA : Cambridge University Press, 2018
Rating:
|
2018
Kiriazidis, Theo, 1963- author.
London : Routledge, 2018
Rating:
|
2018
Bartsch, Ron
2nd ed
Rating:
|
2018
IFIP International Conference on Digital Forensics (14th : 2018 : New Delhi, India)
Cham, Switzerland : Springer, 2018
Rating:
|
2018
International Conference on Modern Research in Aerospace Engineering
Singapore : Springer, 2018
Rating:
|
2018
Cambridge : Cambridge University Press, 2018
Rating:
|
2018
Cambridge : Intersentia, 2018
Rating:
|
2017
Australia : ABC, 2017
Rating:
|
2017
Du, Haomiao, author
First edition
London : Taylor and Francis, 2017
Rating:
|
2017
DeSombre, Elizabeth R
2nd ed
Rating:
|
2017
Edition fourteen / Colonel Bryan D. Watson, USAF, Commandant, the Judge Advocate General's School, Major Eric H. Frenck, editor-in-chief, Lieutenant Colonel Jennifer F. Cline, Major Graham H. Bernstein, Major Seth W. Dilworth, Major Jenny A. Liabenow, Major Micah C. McMillan, executive editors
Maxwell Air Force Base, Ala. : The Judge Advocate General's School, 2017
Rating:
|
2017
Cancian, Mark.
Washington DC : Center for Strategic and International Studies (CSIS), [2017]
Rating:
|
2017
McCullough, Brian P., author
First edition
London : Taylor and Francis, 2017
Rating:
|
2017
Trujillo, Alan P.
Twelth edition
Boston Pearson, [2017]
Rating:
Request It
|
2017
Kingston, Suzanne, 1977- author
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2017
Rating:
Request It
|
2017
Helal, Moufid I., author
New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2017
Rating:
|
2017
Ortlepp, Anke, author.
Athens : The University of Georgia Press, [2017]
Rating:
|
Add Marked to Bag
Add All On Page
|