Title Scanning probe microscopy : characterization, nanofabrication and device application of functional materials / edited by Paula Maria Vilarinho, Yossi Rosenwaks and Angus Kingon

Published Dordrecht ; Boston : Kluwer Academic Publishers, ©2005

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Description 1 online resource (xxxvii, 488 pages) : illustrations Series NATO science series. Series II, Mathematics, physics, and chemistry ; v. 186 NATO science series. Series II, Mathematics, physics, and chemistry ; v. 186. Contents Part I Fundamentals of Functional Materials -- Functional Materials: Properties, Processing and Applications / P.M. Vilarinho -- Scaling of Silicon-Based Devices to Submicron Dimensions / A.I. Kingon -- Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy / J.F. Scott Part II Fundamentals of Scanning Probe Techniques -- Principles of Basic and Advanced Scanning Probe Microscopy / D.A. Bonnell and R. Shao -- Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy / L.M. Eng -- Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy / Y. Rosenwaks and R. Shikler -- Expanding the Capabilities of the Scanning Tunneling Microscope / K.F. Kelly, Z.J. Donhauser, B.A. Mantooth and P.S. Weiss -- Functions of NC-AFM on Atomic Scale / S. Morita, N. Oyabu, T. Nishimoto, R. Nishi, O. Custance, I. Yi and Y. Sugawara Part III Application of Scanning Techniques to Functional Materials -- Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials / S.V. Kalinin and D.A. Bonnell -- SFM-Based Methods for Ferroelectric Studies / A. Gruverman -- Scanning Tunneling Spectroscopy / M. Morgenstern -- Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films / L.M. Eng -- Microscale Contact Charging on a Silicon Oxide / S. Morita, T. Uchihashi, K. Okamoto, M. Abe and Y. Sugawara -- Constructive Nanolithography / S.R. Cohen, R. Maoz, J. Sagiv -- Nanometer-Scale Electronics and Storage / K.F. Kelly, Z.J. Donhauser, P.A. Lewis, R.K. Smith and P.S. Weiss Part IV Contributed papers -- Stm Tips Fabrication for Critical Dimension Measurements / A. Pasquini, G.B. Picotto and M. Pisani -- Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4 / C. Canalias, R. Clemens, J. Hellström, F. Laurell, J. Wittborn and H. Karlsson -- Imaging Local Dielectric and Mechanical Responses with Dynamic Heterodyned Electrostatic Force Microscopy / D.R. Oliver, K.M. Cheng, A. PU, D.J. Thomson and G.E. Bridges -- AFM Patterning of SrTiO3-{breve}c Thin Films and Device Applications / L. Pellegrino -- Nanoscale Investigation of a Rayleigh Wave on LiNbO3 / J. Yang and R. Koch -- Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2 / G. Tallarida, S. Spiga and M. Fanciulli -- Electrical Characterisation of III-V Buried Heterostructure Lasers by Scanning Capacitance Microscopy / O. Douheret, K. Maknys and S. Anand -- Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy / L. Ozyuzer, J.F. Zasadzinski, N. Miyakawa and K.E. Gray -- Annealing Influence on Co Ultrathin Film Morphology in MBE Grown Co/Au Bilayers / A. Wawro, L.T. Baczewski, P. Pankowski, P. Aleszkiewicz, M. Kisielewski, I. Sveklo and A. Maziewski -- Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration / A. Rinkevich, L. Romashev and V. Ustinov -- Magnetoresistance and Microstructure of Magnetic Thin Film Multilayers / J. Neamtu and M. Volmer -- SPM Investigation of Thiolated Gold Nanoparticle Patterns Deposited on Different Self-Assembled Substrates / F. Sbrana, M.T. Parodi, D. Ricci and E. Di Zitti -- AFM of Guanine Adsorbed on HOPG under Electrochemical Control / A.-M. Chiorcea and A.M. Oliveira Brett -- Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy / Z.V. Leonenko and D.T. Cramb Summary As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution SPM is being successfully applied for nanoscale characterization of ferroelectric thin films In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials This book will contribute to the continuous education and development in the field of nanotechnology Analysis oppervlakten surfaces grensvlak interface nanotechnologie nanotechnology condenseren condensation fysica physics optische instrumenten optical instruments optica optics Physics (General) Fysica (algemeen) Bibliography Includes bibliographical references Notes Print version record In OhioLINK electronic book center SpringerLink Subject Materials -- Microscopy -- Congresses Scanning probe microscopy -- Congresses TECHNOLOGY & ENGINEERING -- Material Science. Materials -- Microscopy. Scanning probe microscopy. Materials -- Microscopy Scanning probe microscopy Genre/Form proceedings (reports) Conference papers and proceedings Conference papers and proceedings. Actes de congrès. Form Electronic book Author Vilarinho, Paula Maria Rosenwaks, Yossi Kingon, Angus I LC no. 2005278733 ISBN 1402030193 9781402030192 1402030177 9781402030178 1402030185 9781402030185 6610263701 9786610263707

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