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Title Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert
Published New York : IEEE Press, ©2001
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Description 1 online resource (xxii, 372 pages) : illustrations
Summary As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer's "toolbox" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST). The Accelerated Stress Testing Handbook delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product's life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame. Important topics covered include: Theoretical basis for AST General AST best practices AST design and manufacturing processes AST equipment and techniques AST process safety qualification In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs
Bibliography Includes bibliographical references (pages 340-363) and index
Notes Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. MiAaHDL
Print version record
digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
Subject Electronic apparatus and appliances -- Testing.
Electronic apparatus and appliances -- Reliability.
Environmental testing.
accelerated weathering.
Electronic apparatus and appliances -- Reliability.
Electronic apparatus and appliances -- Testing.
Environmental testing.
Electrical & Computer Engineering.
Engineering & Applied Sciences.
Electrical Engineering.
Genre/Form Electronic books
Form Electronic book
Author Chan, H. Anthony, 1952-
Englert, Paul J, 1960-
LC no. 00054186
ISBN 9780470544051