Title Atomic and nuclear analytical methods : XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques / H.R. Verma

Published Berlin ; New York : Springer, ©2007

Click on the following:
Springer Physics and Astronomy eBooks
Springer eBooks

Copies

Description 1 online resource (xiv, 375 pages) : illustrations Contents X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE) -- Rutherford Backscattering Spectroscopy -- Elastic Recoil Detection -- Mössbauer Spectroscopy (MS) -- X-Ray Photoelectron Spectroscopy -- Neutron Activation Analysis -- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission -- Accelerator Mass Spectrometry (AMS) Summary Features a blend of analytical methods based on the phenomenon of atomic and nuclear physics. This book comprises comprehensive presentations about: X-ray Fluorescence (XRF); Mossbauer Spectroscopy (MS); X-ray Photoelectron Spectroscopy (XPS); Neutron- Activation Analysis (NAA); Particle Induced X-ray Emission Analysis (PIXE); and more Analysis fysica physics materialen materials condenseren condensation instrumentatie instrumentation analytische scheikunde analytical chemistry kernfysica nuclear physics materiaalkunde materials science elektromagnetisme electromagnetism optica optics meettechnieken measurement techniques Physics (General) Fysica (algemeen) Bibliography Includes bibliographical references (pages 341-364) and index Notes Print version record Subject Spectrum analysis. Particles (Nuclear physics) Elementary Particles particle physics. SCIENCE -- Physics -- Optics & Light. Particles (Nuclear physics) Spectrum analysis. Physique. Particles (Nuclear physics) Spectrum analysis Beschleuniger-Massenspektrometrie Ionenstrahlanalyse Neutronenaktivierungsanalyse Röntgen-Photoelektronenspektroskopie Röntgenspektroskopie Mössbauer-Spektroskopie. Form Electronic book LC no. 2006940685 ISBN 9783540302797 3540302794 3540302778 9783540302773 9786610853243 661085324X

  Permalink