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Book Cover
Author Will, Georg

Title Powder diffraction : the Rietveld method and the two-stage method to determine and refine crystal structures from powder diffraction data / Georg Will
Published Berlin ; New York : Springer, ©2006


Description 1 online resource (ix, 224 pages) : illustrations
Series [ProQuest Ebook Central]
[ProQuest Ebook Central]
Contents General Considerations -- The Rietveld Method -- The Two Stage Method
Summary Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application
Bibliography Includes bibliographical references (pages 195-202) and index
Notes UofL: 3 simultaneous users
Print version record
In Springer e-books
Subject Rietveld method.
X-rays -- Diffraction.
X-Ray Diffraction
x-ray diffraction.
SCIENCE -- Physics -- Crystallography.
X-rays -- Diffraction.
Difração por raios x.
Rietveld method.
Sciences de la terre.
Rietveld method
X-rays -- Diffraction
Difração por raios x.
Form Electronic book
LC no. 2005931757
ISBN 9783540279860