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Authors (Last name first) (1-3 of 3)
Pineda de Gyvez, José.
1
E-book
2007

Defect-oriented testing for nano-metric CMOS VLSI circuits


Sachdev, Manoj.
Dordrecht : Springer, [2007]

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2
E-book
1999

Integrated circuit manufacturability : the art of process and design integration



Piscataway, NJ : IEEE Press ; New York : Institute of Electrical and Electronics Engineers, [1999]

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3
E-book
2011

Low-power high-resolution analog to digital converters : design, test and calibration


Zjajo, Amir.
Dordrecht ; New York : Springer, [2011]

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