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1
E-book
2023

Interconnect reliability in advanced memory device packaging


Gan, Chong Leong, author

Cham, Switzerland : Springer, [2023]

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5
E-book
2016

Mitigating tin whisker risks : theory and practice




Hoboken, New Jersey : John Wiley & Sons, Inc., [2016]

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7
E-book
2012

Lead-free solders : materials reliability for electronics




Chichester, West Sussex : Wiley, 2012

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8
10
E-book
2010

ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA


International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.)

Materials Park, Ohio : ASM International, 2010

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14
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22
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