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 Most relevant titles entries 1-4 |
2016
Huang, Hongwen, 1957- author.
Amsterdam : Academic Press is an imprint of Elsevier ; Beijing : Science Press, [2016]
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2013
First edition
Amsterdam : Academic Press, [2013]
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1993
Epping, N.S.W. : R & R Publishing, 1993
Rating:
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 Very relevant titles entries 5-48 |
2024
PSIVT (Symposium) (11th : 2023 : Auckland, New Zealand)
Singapore : Springer, 2024
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2024
Devoy, Susan, author.
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2024
Kole, Chittaranjan
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2023
Singapore : Springer, [2023]
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2021
Hussain, Syed Zameer, author
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2021
Singapore : Springer, [2021]
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2021
Su, Adrienne, 1967- author.
Pittsburgh, Pa. : University of Pittsburgh Press, [2021]
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2020
Cambridge : Burleigh Dodds Science Publishing, 2020
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2020
Mandal, Debashis
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2019
Palou, Lluis
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2019
Murad, Ferid.
Sharjah : Bentham Science Publishers, 2019
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2019
Low, Kathleen, author
Jefferson, North Carolina : McFarland & Company, Inc., Publishers, [2019]
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2018
Abingdon, Oxon ; New York, NY : Routledge, 2018
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2018
Duttaroy, Asim K., author
Hoboken, NJ : John Wiley & Sons Ltd, 2018
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2017
Amsterdam : Academic Press, $c [2017]
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2016
Heron, Richard Le
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2014
Australia : SBS ONE, 2014
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2014
Thompson, A. K. (A. Keith)
Third edition
Hoboken, New Jersey : John Wiley & Sons Inc., 2014
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2014
New York : Peter Lang, [2014]
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2014
New York : Nova Publishers, [2014]
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2014
International Conference on Mechatronics and Intelligent Materials (2014 : LiJiang, China)
Zurich, Switzerland : Trans Tech Publications, [2014]
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2014
Berlin ; Boston : Walter de Gruyter GmbH & Co., KG, [2014]
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2013
CCTA (Conference) (2012 : Zhangjiajie Shi, China)
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2012
Hoboken : Wiley-Blackwell, 2012
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2011
International Conference on Computational Materials Science (2011 : Guangzhou, China)
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2011
Oxford ; Philadelphia : Woodhead Publishing, 2011
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2011
Terry, Leon A
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2010
First edition
Amsterdam ; Boston : Academic Press, 2010
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2007
Hoboken, N.J. : Wiley ; Chichester : John Wiley [distributor], 2007
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2005
Smith, Aaron, 1974-
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2000
Joint AOAC/FAO/IAEA/IUPAC International Workshop on the Principles and Practices of Method Validation (1999 : Budapest, Hungary)
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2000
Delaplane, Keith S
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1995
Washington, DC : American Chemical Society, 1995
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