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Very relevant titles entries 1-15 |
2021
Stevenage : Institution of Engineering & Technology, 2021
Rating:
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2020
Smallwood, J. M. (Jeremy M.), author.
Hoboken : Wiley-IEEE Press, 2020
Rating:
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2017
Bafleur, Marise, author
London : ISTE Press ; Oxford : Elsevier Ltd., 2017
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2016
Australia : SBS 2, 2016
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2015
Voldman, Steven H
2nd ed
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2012
Voldman, Steven H.
Oxford : Wiley-Blackwell, 2012
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2012
Voldman, Steven H
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2010
Shabany, Younes
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2009
Mardiguian, Michel
3rd ed
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2008
Semenov, Oleg.
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2006
Welker, R. W., author
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2000
Boxleitner, Warren.
Rating:
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1999
Sclater, Neil.
New York : McGraw-Hill, 1999
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1988
Philadelphia, PA : ASTM, [1988]
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Electrical Overstress/Electrostatic Discharge Symposium
Griffiss AFB, NY : Reliability Analysis Center
Rating:
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Other relevant titles entries 16-60 |
2021
Hartwell, Frederic P., author
Thirtieth edition
New York, N.Y. : McGraw-Hill Education, [2021]
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2021
Fifth edition
Peachtree Corners, GA : ASHRAE : Peachtree Corners, [2021]
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2021
Hartwell, Frederic P., author
Seventeenth edition
New York, N.Y. : McGraw-Hill Education, [2021]
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2020
Baba, Yoshihiro, author
Stevenage The Institution of Engineering and Technology 2020
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2020
Domingo, George, 1937- author.
First edition
Hoboken, NJ, USA : Wiley, [2020]
Rating:
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2019
Scaddan, Brian, author.
16th edition ; Sixteenth edition
Abingdon, Oxon : Routledge/Taylor & Francis Group, 2019
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2018
Helvoort, Mark Van, author
Boca Raton, FL : CRC Press/Taylor & Francis Group, 2018
Rating:
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2017
Loznen, Steli, 1952- author.
Boston, Massachusetts : Artech House, [2017]
Rating:
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2017
Hartwell, Frederic P., author
29th edition
New York, N.Y. : McGraw-Hill Education, [2017]
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2017
Wotschke, Peter
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2017
Wotschke, Peter, author
Basel, Switzerland : Birkhäuser, [2017]
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2017
Small, James E., author
Cham, Switzerland : Springer, 2017
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2016
Williams, Tim
5th ed
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2015
Duvvury, Charvaka, 1944-
Hoboken : John Wiley and Sons, Inc., 2015
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2015
Deshpande, R. P., author
New York : McGraw-Hill Education, [2015]
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2015
Scaddan, Brian
4th ed
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2015
Davis, Eddie, author
New York, NY : Springer, 2015
Rating:
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2014
Sutherland, Peter E.
Hoboken, New Jersey : IEEE Press, [2014]
Rating:
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2014
International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)
Materials Park, Ohio : ASM International, 2014
Rating:
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2014
Second edition
Atlanta [GA] : ASHRAE, [2014]
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2014
Hu, Junhui, author.
Rating:
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2014
Hartwell, Frederic P., author.
28th ed
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2012
Scaddan, Brian
3rd ed
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2011
Scaddan, Brian.
7th ed
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2011
Billings, Keith H.
3rd ed
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2010
Hoboken, N.J. : Wiley, 2010
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2010
Australia : ABC, 2010
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2010
New York : Nova Science, 2010
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2010
Keller, K. J. (Kimberley J.)
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2010
Greve, Albert, 1938-
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2009
Ardebili, Haleh.
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2008
Shina, Sammy G.
Rating:
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2008
Shina, Sammy G.
New York : McGraw-Hill, [2008]
Rating:
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