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 Most relevant titles entries 1-1 |
1991
[Hoboken, NJ] : John Wiley and Sons, 1984-1991
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 Very relevant titles entries 2-37 |
2024
Okolie, Jude A
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2023
Frank, Joachim.
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2023
Michler, Goerg H. (Goerg Hannes), author.
Wiesbaden, Germany : Springer, [2023]
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2017
Ross, Frances M., 1964- author, editor.
New York, NY : Cambridge University Press, 2017
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2016
New York, NY : Humana Press, 2016
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2015
International Conference on Electron Microscopy (15th : 2014 : Kraków, Poland)
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2014
Glauert, Audrey M
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2011
Gaithersburg, MD : National Institute of Standards and Technology (NIST), 2011
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2010
Amsterdam ; Boston : Academic, 2010
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2008
Spence, John C. H
3rd ed
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2005
Dietrich, Jens
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2003
International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)
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2003
Morel, Gérard
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1999
Maunsbach, Arvid Bernhard.
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1998
Maunsbach, Arvid B
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1989
Boca Raton, Fla. : CRC Press, [1989]
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1985
Robards, A. W. (Anthony William)
Amsterdam ; New York : Elsevier ; New York, NY, U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1985
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1985
Goodhew, Peter J.
Amsterdam ; New York : Elsevier, 1985
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1981
Hayat, M. A., 1936-
New York : Academic Press, 1981
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1981
Butler, E. P.
Amsterdam : North-Holland, 1981
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1980
Willison, J. H. Martin.
Amsterdam ; New York : North-Holland Pub. Co. ; New York, N.Y. : Sole distributors for the U.S.A. and Canada, Elsevier/North-Holland, 1980
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1978
Misell, D. L.
Amsterdam : North-Holland, 1978
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1977
Lewis, P. R.
Laboratory edition
Amsterdam : North-Holland ; New York : American Elsevier, 1977
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1977
Williams, M. A.
Laboratory edition
Amsterdam : North-Holland, 1977
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1977
Lewis, P. R.
Amsterdam : North-Holland ; New York : American Elsevier, 1977
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1974
Glauert, Audrey M.
Amsterdam : North-Holland ; New York : American Elsevier, 1974
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1967-
Sjöstrand, Fritiof S. (Fritiof Stig), 1912-
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1965
Kay, Desmond.
Second edition
Oxford : Blackwell Scientific, 1965
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1961
Haine, Michael Edward.
London : E. and F.N. Spon, 1961
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New York, NY : Wiley-Liss
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 Relevant titles entries 38-38 |
2016
Li, Shuo
Cambridge, MA MyJoVE Corp 2016
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 Other relevant titles entries 39-372 |
2024
Bahadur Singh, Virendra
1st ed
Newark : John Wiley & Sons, Incorporated, 2024
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2024
Characterization of Minerals, Metals, and Materials (Symposium) (2024 : Orlando, Fla.)
Cham : Springer, 2024
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2024
Second edition
Amsterdam : Elsevier, [2024]
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2024
International Conference on Advanced Functional Materials and Devices (2nd : 2023 : Online)
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2024
Taylor and Francis Group 2024
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2023
Munaweera, Imalka
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2023
Sharma, Renu
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2023
Ooi, Poh Choon
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2023
Panigrahi, Muktikanta, author
Hoboken, NJ : John Wiley & Sons, Inc. ; Beverly, MA : Scrivener Publishing LLC, 2023
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2023
Alegaonkar, Ashwini P
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