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2024
Fletcher, James Rupert, author.
Abingdon, Oxon ; New York, NY : Routledge, 2024
Rating:
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2024
IWAIPR (Workshop) (8th : 2023 : Varadero, Cuba)
Cham : Springer, [2024]
Rating:
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2024
International Conference on Recent Trends in Image Processing and Pattern Recognition (6th : 2023 : Derby, England)
Cham : Springer, 2024
Rating:
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2024
International Conference on Data Science and Applications (4th : 2023 : Jaipur, India)
Singapore : Springer, [2024]
Rating:
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2024
LOD (Conference) (9th : 2023 : Grasmere, England)
Cham : Springer, 2024
Rating:
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2024
Denault, Jean-Francois
Rating:
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2024
Gibbs, Daniel, author.
Cambridge, United Kingdom ; New York, NY, USA : Cambridge University Press, 2024
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2024
Second edition
Cham : Springer, 2024
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2023
Academic Press 2023
Rating:
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2023
Second edition
New York, NY : Humana Press, 2023
Rating:
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2023
Gibbs, Daniel, author.
Second edition
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2023
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2023
New York, NY : Humana Press, [2023]
Rating:
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2023
Singapore : Springer, 2023
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2023
Behl, Christian, author.
Cham : Springer, [2023]
Rating:
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2023
Singapore : Springer, 2023
Rating:
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2023
Cham : Springer, [2023]
Rating:
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2023
International Graphonomics Society. Conference (21st : 2023 : Évora, Portugal)
Cham : Springer, [2023]
Rating:
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2023
Cham, Switzerland : Springer, [2023]
Rating:
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2023
International Conference on Machine Learning and Big Data Analytics (2nd : 2022 : Indian Institute of Technology, Patna, India)
Cham : Springer, [2023]
Rating:
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2023
MLCN (Workshop) (6th : 2023 : Vancouver, B.C.)
Cham : Springer, [2023]
Rating:
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2023
Cham : Springer, [2023]
Rating:
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2023
TICEC (Conference) (11th : 2023 : Cuenca, Ecuador)
Cham : Springer, [2023]
Rating:
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2023
Singapore : Springer, [2023]
Rating:
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2023
Singapore : Springer, [2023]
Rating:
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2023
Cham, Switzerland : Springer, [2023]
Rating:
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2023
Singapore : Springer, [2023]
Rating:
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2023
GeNeDis (Conference) (5th : 2022), author.
Cham, Switzerland : Springer, [2023]
Rating:
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2023
Amsterdam : Elsevier, [2023]
Rating:
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2022
Eighth edition
Detroit, MI : Omnigraphics, [2022]
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2022
Rudrapal, Mithun
Rating:
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2022
Barh, Debmalya
Rating:
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2022
London : Bloomsbury Publishing, 2022
Rating:
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2022
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2022
Rating:
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2022
Eighth edition
Edinburgh : Elsevier, [2022]
Rating:
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2022
Budson, Andrew E., author
Third edition
Philadelphia, PA : Elsevier, [2022]
Rating:
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2022
Hoboken, NJ : John Wiley & Sons, Inc., 2022
Rating:
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2022
Burk, Scott
New York, NY : Routledge, 2022
Rating:
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2022
New York, NY Oxford University Press [2022]
Rating:
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2022
Selberg, Scott, 1977- author.
©2022
Rating:
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2022
International Conference on Applied Intelligence and Informatics (2nd : 2022 : Reggio di Calabria, Italy)
Cham : Springer, [2022]
Rating:
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2022
MOBILE (Conference) (3rd : 2022 : Online)
Rating:
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2022
Second edition
Cham : Springer, [2022]
Rating:
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2022
Singapore : Springer, [2022]
Rating:
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2022
International Conference on Communication Engineering and Technology (7th : 2022 : Lonere, India)
Singapore : Springer, 2022
Rating:
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2022
Eighth edition
Cham : Springer, [2022]
Rating:
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2022
Cham, Switzerland : Springer, 2022
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2022
International Conference on Computational Intelligence (2020 : Online)
Rating:
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2022
Cham : Springer, [2022]
Rating:
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2022
Klimaschewski, Lars P
Rating:
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