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Author Balakrishnan, N., 1956- author.

Title Accelerated life testing of one-shot devices : data collection and analysis / Narayanaswamy Balakrishnan, McMaster University, Hamilton, Canada, Man Ho Ling, the Education University of Hong Kong, Tai Po, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo, Canada
Edition First edition
Published Hoboken, NJ, USA : Wiley, 2021
Online access available from:
ProQuest Ebook Central    View Resource Record  


Description 1 online resource (xiii, 223 pages) : illustrations
Contents Front Matter -- One-Shot Device Testing Data -- Likelihood Inference -- Bayesian Inference -- Model Mis-Specification Analysis and Model Selection -- Robust Inference -- Semi-Parametric Models and Inference -- Optimal Design of Tests -- Design of Simple Step-Stress Accelerated Life-Tests -- Competing-Risks Models -- One-Shot Devices with Dependent Components -- Conclusions and Future Directions -- Derivation of Hi(a, b) -- Observed Information Matrix -- Non-Identifiable Parameters for SSALTs Under Weibull Distribution -- Optimal Design Under Weibull Distributions with Fixed w1 -- Conditional Expectations for Competing Risks Model Under Exponential Distribution -- Kendall's Tau for Frank Copula
Summary "A one-shot device is a unit that performs its function only once and cannot be used for testing more than once. Examples include electric explosive devices, fire extinguishers, airbags in cars, and missiles. While testing one-shot devices, only the condition of the device at a specific inspection time can be recorded, and exact failure times cannot be obtained from the test. As a result, the lifetimes of devices are either left- or right-censored. Due to a lack of lifetime data collected in life-tests, estimating the reliability of one-shot devices in traditional approaches becomes challenging. This book primarily focuses on fundamental issues of statistical modeling based on one-shot device testing data collected from accelerated life-tests. This book also provides advanced statistical techniques. For instance, expectation-maximization algorithms and Bayesian approaches to deal with the estimation challenges, along with comprehensive data analysis of one-shot devices under accelerated life-tests. Readers may apply the techniques from this book to their own lifetime data with censoring. This book is ideal for graduate students, researchers, and engineers working on accelerated life testing data analysis"-- Provided by publisher
Bibliography Includes bibliographical references and indexes
Notes Description based on online resource; title from digital title page (viewed on July 30, 2021)
Subject Accelerated life testing.
Failure analysis (Engineering)
Equipment Failure Analysis
Accelerated life testing.
Failure analysis (Engineering)
accelerated aging.
Form Electronic book
Author Ling, Man Ho, author.
So, Hon Yiu, author.
LC no. 2020035726
ISBN 1119663946