Description 
1 online resource (xv, 195 pages) : illustrations 
Series 
Lecture notes in electrical engineering, 18761100 ; v. 46 

Lecture notes in electrical engineering ; v. 46.

Contents 
SiLVR: projection pursuit for response surface modeling  QuasiMonte Carlo for fast statistical simulation of circuits  Statistical blockade: estimating rare event statistics  Concluding observations 
Summary 
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not wellequipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be oversimplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. In particular, Novel Algorithms for Fast Statistical Analysis of Scaled Circuits makes three contributions: 1) SiLVR, a nonlinear response surface modeling and performancedriven dimensionality reduction strategy, that automatically captures the designer's insight into the circuit behavior, by extracting quantitative measures of relative global sensitivities and nonlinear correlation. 2) Fast Monte Carlo simulation of circuits using quasiMonte Carlo, showing speedups of 2× to 50× over standard Monte Carlo. 3) Statistical blockade, an efficient method for sampling rare events and estimating their probability distribution using limit results from extreme value theory, applied to high replication circuits like SRAM cells 
Bibliography 
Includes bibliographical references and index 
Notes 
English 

Print version record 
Subject 
Nanoelectronics  Statistical methods


Integrated circuits  Computeraided design


Algorithms.


Algorithms


algorithms.


TECHNOLOGY & ENGINEERING  Electronics  Microelectronics.


TECHNOLOGY & ENGINEERING  Electronics  Digital.


Ingénierie.


Algorithms


Integrated circuits  Computeraided design

Form 
Electronic book

Author 
Rutenbar, Rob A., 1957

ISBN 
9789048131006 

9048131006 
